This paper proposes a Transverse Electric and Magnetic field (TEM) cell that meets the IEC standard to test the electromagnetic compatibility of Integrated Circuits (IC).The TEM cell is featured with less than -12 dB of reflection coefficient and better than -2.5 dB of transmission coefficient in frequency range of 0-3 GHz.The Computer Simulation Technology (CST) software is used to simulate the impedance, S-parameters, field uniformity and the influence of Equipment Under Test (EUT) on the field of the TEM cell, moreover, the TEM cell is fabricated and compared with commercial TEM cell.In addition, an electromagnetic compatibility test board is made according to the IEC standard, which is then used to measure the IC radiation emission with the TEM cell.The analysis of the measurement results indicates some aspects to improve the electromagnetic compatibility of the integrated circuits.